Highly oriented perpendicular Co-alloy media on Si„111... substrates
نویسندگان
چکیده
CoCrPt/Ti/Ag films with the easy axes of the hexagonal-closed-pack Co grains perpendicular to the film plane were epitaxially grown on HF-etched Si~111! single crystal substrates by rf sputter deposition. The orientation relationship was determined by x-ray pole figure measurements and transmission electron microscopy to be CoCrPt~0001!@101̄0#iTi~0001!@101̄0#iAg~111!@112̄# 3iSi~111!@112̄#. The magnetic properties of the CoCrPt films were greatly improved by introducing these single crystal templates. Rocking curve measurement showed a greatly improved c-axis orientation of the cobalt alloy. Highly oriented, high coercivity properties for perpendicular recording have been obtained. © 1999 American Institute of Physics. @S0021-8979~99!51608-3#
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